nanome|x
The nanome|x is an ultra high-resolution nanofocus® X-ray system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. This system is upgradable to a nanoCT®.
Possible applications include:
Special features:
- Max. inspection area 24“ x 22“
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Real-time detector resolution of 2 or 4 megapixel
- 24" TFT display with 2 megapixel detector resolution
- 30" TFT display with 4 megapixel detector resolution
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Detail detectability of <0,3µ (300nm)
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Max. magnification up to 25.000x
- Max. tube voltage of 180kV / 15W
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Automated X-ray inspections of BGAs, CSPs, QFPs, QFNs, PTHs, Voiding Calculation, Wire Sweep
- optional 3D computed tomography
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Low-maintenance, long-life (open) nanofocus® tube
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High-power nanofocus® tube
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Steplessly adjustable up to 70°, rotation 0°-360°
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Integrated noise suppression system
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Ergonomically designed control panel
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Easy-view-configuration: the X-ray image shows the object exactly as the operator sees it through the radiation protection window.
For more information on this particular X-ray inspection system, please contact us, we will be more than glad to answer your question!
