nanome|x
The nanome|x is an ultra high-resolution nanofocus X-ray system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. This system is upgradable to a nanoCT®.
Possible applications include:
Special features:
- Max. inspection area 24“ x 22“
- Real-time detector resolution of 2 or 4 megapixel
- 24" TFT display with 2 megapixel detector resolution
- 30" TFT display with 4 megapixel detector resolution
- Detail detectability of 0,2µ (200nm)
- Max. magnification up to 25.000x
- Max. tube voltage of 180kV / 15W
- Automated X-ray inspections of BGAs, CSPs, QFPs, QFNs, PTHs, Voiding Calculation, Wire Sweep
- optional 3D computed tomography
- Low-maintenance, long-life (open) nanofocus tube
- High-power nanofocus tube
- Steplessly adjustable up to 70°, rotation 0°-360°
- Integrated noise suppression system
- Ergonomically designed control panel
- Easy-view-configuration: the X-ray image shows the object exactly as the operator sees it through the radiation protection window.
For more information on this particular X-ray inspection system, please contact us, we will be more than glad to answer your question!
